Determination of the Optical Constants of Thin Metalllic Films

The current study was performed to determine the optical constants of thin metallic films with the help of ellipsometer. There are many theories like Murmann and Vasick theories which consider the reflection of light beam between the side boundaries. Thermal evaporation technique is used to prepare the thin films of bismuth and antimony. It is supposed to be more easier task to study the material in thin form rather than in the bulk form. There are many applications of thin metallic films. These films can be used in optical devices such as lasers and beam-splitters. These films are used in electronic devices such as resistors, capacitors etc. Vaccum technology is used with the combination of thermal evaporation to prepare the thin metallic films. The current study highlights the method to determine the optical constants of thin metallic films.