Growth and Characterization of Thioureasquarate

By slow evaporation solution growth technique an organic NLO material named as Thioureasquarate was grown using ethanol at room temperature. Stirred mixture of squaric acid and thiourea was taken in equimolar ratio and placed in an open area without any disturbances. Various characterization techniques were used to check the suitability of the grown crystal for device fabrication. UV-Vis-NIR, XRD, TG-DSC, SHG and FTIR analyses were used to characterize the grown crystal. Identification of functional group was done by the FTIR analysis. The occurred transparency cut off wavelength 330nm of the crystal is shown in the UV spectrum. The thermal stability was determined by TG-DSC analysis. Kurtz-Perry SHG test confirms that the grown crystal is a promising NLO material. Finally the suitability of the grown crystal for optical device fabrication was confirmed by the observed results.